| 纪欣言,向树红,刘国青,王晶.一种适用于不同航天器电子产品的热循环试验的循环次数确定方法[J].装备环境工程,2018,15(11):1-6. JI Xin-yan,XIANG Shu-hong,LIU Guo-qing,WANG Jing.Method for Determining Cycling Number for Thermal Cycling Tests of Different Spacecraft Electronics[J].Equipment Environmental Engineering,2018,15(11):1-6. |
| 一种适用于不同航天器电子产品的热循环试验的循环次数确定方法 |
| Method for Determining Cycling Number for Thermal Cycling Tests of Different Spacecraft Electronics |
| 投稿时间：2018-10-12 修订日期：2018-11-25 |
| DOI：10.7643/ issn.1672-9242.2018.11.001 |
| 中文关键词: 热循环试验，热疲劳，试验条件 |
| 英文关键词:thermal cycling test thermal fatigue test condition |
| 基金项目: |
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| Author | Institution |
| JI Xin-yan | 1. Beihang University, Beijing 100191, China;2. Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China |
| XIANG Shu-hong | 2. Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China |
| LIU Guo-qing | 2. Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China |
| WANG Jing | 2. Beijing Institute of Spacecraft Environment Engineering, Beijing 100094, China |
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| 中文摘要: |
| 目的 给不同航天器电子设备提供合适的常压热循环试验条件，使其在不同的循环次数和温度范围下获得相等的应力筛选，提出一种定制化的热循环次数的确定方法。方法 基于热疲劳理论，分析典型航天器热致故障机理，并综合考虑航天器设计、材料、工艺的特点以及历史故障数据分布的影响，引入综合疲劳加速指数和故障沉淀率，形成航天器综合疲劳寿命等效等式。最后以某航天器典型电子设备为例，给出该方法所确定的试验条件。结果 该方法能降低航天器欠试验或过试验的风险。 |
| 英文摘要: |
| Objective To provide proper conditions for thermal cycling test at ordinary temperature of different spacecraft electronic devices to obtain equal stress screening for spacecraft electronic devices under different cycling numbers and temper-atures ranges and propose a customized method for determining the cycling number. Methods Based on the thermal fatigue theory, the typically failure thermal-mechanism were analyzed, and the integrated fatigue acceleration exponent and failure precipitation efficiency were introduced to establish an equivalent fatigue life equation of spacecraft cycling testing, which covers the characteristics of design, material and workmanship, and the history failures data statistics of spacecrafts. The tailored testing condition of typical electronic equipment was given as an example to provide the test condition determined by this method. Results This method can reduce the spacecraft risk of under-testing and over-testing. |
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