多层陶瓷电容器应用与可靠性研究

多层陶瓷电容器(MLCC)在使用过程中电参数会发生不同程度的退化甚至超差失效,降低了其可靠性。引起失效的原因可分为损耗性失效、过应力失效、内部缺陷失效以及外部缺陷失效四类。基于日常失效分析工作中遇到的多层陶瓷电容器失效问题,结合国内外文献调研资料,首先对多层陶瓷电容器制造工艺进行了分析,然后对烧结裂纹、分层及空洞三种内在缺陷以及使用过程中外部应力引起的装配裂纹、热应力裂纹、弯曲裂纹、银迁移等失效模式及其相应的微观失效机理展开了深入讨论,最后对上述失效提出了相应建议和预防措施。

Applications and Reliability Study of MLCCs

The electrical parameters of multilayer ceramic capacitor (MLCC) will be degraded or become to failure severely in the actual application, so the reliability will be degraded too. The cause of the failure can be divided into four parts: wearout failure, overstress failure, intrinsic defects and extrinsic defects. Based on the failure analysis of multilayer ceramic capacitors and the literatures reported home and domestic for reference, the manufacturing process of multilayer ceramic capacitor is analyzed firstly. Then, the failure mechanism of three kinds of intrinsic defects such as firing crack, delamination and void, as well as the handing cracks, thermal cracks, flex cracks and silver migration caused by extrinsic stress is discussed in detail. Finally, the corresponding suggestions and preventive measures of the failure are put forward.