Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends |
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| Authors: | Lee Li-Ting Ito Shinzaburo Benten Hiroaki Ohkita Hideo Mori Daisuke |
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| Institution: | Department of Material Science and Engineering, Feng Chia University, Taiwan. ltlee@fcu.edu.tw |
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| Abstract: | A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM. |
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