| 低温环境试验条件恢复的防凝露问题 |
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| 引用本文： | 李颖,杨喜存,单军勇.低温环境试验条件恢复的防凝露问题[J].装备环境工程,2013,10(5):112-115. |
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| 作者姓名： | 李颖 杨喜存 单军勇 |
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| 作者单位： | 1. 西南技术工程研究所,重庆,400039
2. 西安电子工程研究所,西安,710100 |
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| 摘 要： | 综合分析了电子产品在做完低温环境试验后,采取条件恢复方法进行恢复处理的利与弊,重点分析了采用直接快速升温对产品进行恢复处理是导致试件凝露的主要原因,通过论证试验提出了2种解决问题的方法,通过验证试验证明,这2种新的恢复方法科学合理、简单易行、效果良好。
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| 关 键 词： | 低温环境试验 旧法 烘干 凝露 原因分析 新法 |
| 收稿时间： | 2013/5/31 0:00:00 |
| 修稿时间： | 9/1/2013 12:00:00 AM |
Prevention of Water Condensation during Condition Restoration Phase of Low-temperature Environmental Test |
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| LI Ying,YANG Xi-cun and SHAN Jun-yong.Prevention of Water Condensation during Condition Restoration Phase of Low-temperature Environmental Test[J].Equipment Environmental Engineering,2013,10(5):112-115. |
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| Authors: | LI Ying YANG Xi-cun and SHAN Jun-yong |
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| Institution: | LI Ying;YANG Xi-cun;SHAN Jun-yong;Southwest Technology and Engineering Research Institute;Xi′an Electronic Engineering Research Institute; |
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| Abstract: | Advantages and disadvantages of electronic product specimen treatment by condition restoration method after low-temperature environmental test were analyzed comprehensively.The main causes of water condensation on test-piece by direct and rapid temperature rise method were analyzed.Two methods were put forward to solve the problem.Verification test result showed that the methods are scientific,reasonable,simple,and effective. |
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| Keywords: | low-temperature environmental test old method drying condensation water of cause analysis new method |
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