| 基于GJB 150A-2009的高温试验方法研究 |
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| 引用本文： | 翁雷,刘岩.基于GJB 150A-2009的高温试验方法研究[J].环境技术,2012(5):10-14. |
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| 作者姓名： | 翁雷 刘岩 |
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| 作者单位： | 江南计算技术研究所,无锡,214083 |
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| 摘 要： | 介绍了GJB 150换版后的基本信息,以图表形式给出了高温对装备的影响及比重。对GJB150A-2009中的高温试验方法及剪裁指南进行了研究,对高温试验应用要点进行了分析,并以某型号电子装备为例,建立了其寿命期剖面和寿命期环境剖面。
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| 关 键 词： | GJB 150A-2009 高温试验 剪裁 环境剖面 |
Investigation on the High-Temperature Test of GJB 150A-2009 |
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| WENG Lei
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LIU Yan.Investigation on the High-Temperature Test of GJB 150A-2009[J].Environmental Technology,2012(5):10-14. |
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| Authors: | WENG Lei LIU Yan |
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| Institution: | (JiangNan Institute of Computing Technology, Wuxi 214083) |
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| Abstract: | This paper introduces the basis information of new version of GJBI50, and provides the effect and proportion of high temperature for equipments in the form of charts. In addition, the high temperature test and the tailor methods of GJB 150A-2009 are researched and the profile outlines on the application of the high temperature test are analyzed. The life-span and environment profile are designed by way of the electron equipment |
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| Keywords: | GJB 150A-2009 high-temperature test tailor environment profile |
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