航空电子设备大气辐射环境的危害影响分析

目的调查航空电子设备在典型民用飞行高度(8 000～12 000 m)下大气辐射环境的危害影响。方法利用14 MeV高能中子源对航空电子设备用CPU、DSP、FPGA及存储器开展了辐照试验,获取了各试件的单粒子效应敏感特性,采用民航高度下大气中子注量率的典型值6000n/(cm~2·s),预计典型航空电子设备在巡航高度下可能发生的软错误率。结果约900h内,该航空电子设备会由于大气辐射单粒子效应诱发一次错误。结论在不采取针对性防护措施的前提下,大气中子诱发的单粒子效应将严重影响航空电子设备可靠性、维修性,甚至危及飞行安全。

Hazard Effects of Atmospheric Radiation Environment on Avionics

Objective To investigate the hazard effects of atmospheric radiation environment on avionics at typical civil flight altitudes (8 000 m to 12 000 m). Methods The 14 MeV high-energy neutron source was used to conduct irradiation tests on CPU, DSP, FPGA and memory for avionics. The single event effect sensitivity of each test piece was obtained. The typical value (6000 n/(cm2.s)) of the atmospheric neutron flux at the altitude of civil aviation was adopted to estimate the single event effect rate of typical avionics at cruising altitude. Results The avionics would cause a single particle effect of atmospheric radiation within about 900 hours. Conclusion Under the premise of not taking targeted protective measures, the single event effect induced by atmospheric neutrons will seriously affect the reliability and maintainability of avionics and even endanger flight safety.