基于Wiener过程的电子测量设备性能退化建模与寿命预测

目的开展电子测量设备寿命预测,评价其健康状态,提升装备状态监测的准确性,充分发挥装备性能。方法利用电子测量设备长期观测的性能退化数据,基于Wiener过程建立电子测量设备性能退化模型和可靠性模型,并结合环境剖面参数,进行性能退化模型参数估计。结果以某型电子测量设备为例,建立了拟合性较好的性能退化建模,并进行寿命预测。结论该方法降低了电子测量设备在寿命预测过程中的试验成本,提升了寿命预测技术的实践能力,具有一定的工程应用价值。

Performance Degeneration Modeling and Life Prediction of Electronic Measuring Equipment Based on Wiener Process

Objective To predict the life of electronic measuring equipment, evaluate its health state, improve the accuracy of equipment condition monitoring and give full play to the equipment performance. Methods Based on the Wiener process, the performance degradation model and reliability model of the electronic measurement equipment were established, and the model parameters were estimated in combination with the degradation data and the environmental parameters of the electronic measuring equipment. Results With a certain type of electronic measuring equipment as an example, the performance degradation modeling with better fitting was built, and life prediction was carried out. Conclusion This method reduces the test cost of the electronic measuring equipment in the life prediction, improves the practical ability of the life prediction technology, and has certain engineering application value.