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| 电子设备的环境应力损伤模型 | |
| 引用本文： | 王云,邵将,曾晨晖. 电子设备的环境应力损伤模型[J]. 装备环境工程, 2010, 7(6): 213-216 |
| 作者姓名： | 王云 邵将 曾晨晖 |
| 作者单位： | 中国航空综合技术研究所,北京100028 |
| 摘 要： | 介绍了环境应力损伤模型的基本概念以及电子设备环境应力损伤模型的分类,重点研究在典型环境条件下电子设备的环境应力损伤模型,总结了加速试验和故障机理分析两种试验验证方法。 |
| 关 键 词： | 电子设备 应力损伤模型 验证 |
Environmental Stress Damage Model of Electronic Product |
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| WANG Yun,SHAO Jiang,ZENG Chen-hui. Environmental Stress Damage Model of Electronic Product[J]. Equipment Environmental Engineering, 2010, 7(6): 213-216 | |
| Authors: | WANG Yun SHAO Jiang ZENG Chen-hui |
| Affiliation: | (China Aero-Polytechnology Establishment,Beijing 100028,China) |
| Abstract: | The concept and classification of environmental stress damage model of electronic product was introduced.The stress damage models of electronic product in typical environments were analyzed.Test and validation methods for the models were summarized,which were accelerated test and failure mechanism analysis. |
| Keywords: | electronic product stress damage model validation |
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