首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Physicochemical substance properties as indicators for unreliable exposure in microplate-based bioassays
Authors:Riedl Janet  Altenburger Rolf
Institution:

aUFZ – Helmholtz Centre for Environmental Research, Department Bioanalytical Ecotoxicology, Permoserstrasse 15, 04318 Leipzig, Germany

Abstract:In the last years many efforts were made to transform standardized algal test protocols into low-cost microplate assays. While advantages were pointed out frequently, limitations are not systematically addressed, thus hindering a widespread utilisation. In this study a group of organic substances with a wide distribution of volatility (log KAW from −6.53 to −2.13) and lipophilicity (log KOW from 1.26 to 4.92) was investigated with respect to the influence of these physicochemical properties on their algal toxicity in different assays. Therefore the EC50 values were determined with a microplate assay based on ISO 8692 protocol and the results were compared with those of an established algal growth inhibition test conducted in air tight glass vessels. Using the ratio of the EC50 values, a clear connection between biological response and volatility as well as lipophilicity of test substances could be detected. Chemicals with a log KOW higher than 3 or a Henry coefficient log KAW higher than −4 were identified as less effective in the microplate assay than in the comparative assay. The loss in nominal concentration due to physicochemical properties could be shown to contribute to this using HPLC analysis. Consequently, when using microplate assay’s one should be aware that lipophilic and volatile chemicals might be underestimated in their toxicity, which could be indicated from evaluating related physicochemical properties modelled from structural information prior to an experimental investigation.
Keywords:Algal growth inhibition test  Microplate bioassay  Exposure concentration  Difficult test substances  Toxicity assessment
本文献已被 ScienceDirect PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号