| 臭氧发生系统中半导体制冷干燥装置的研制 |
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| 引用本文： | 时国富,储金宇,陈万金,张文英.臭氧发生系统中半导体制冷干燥装置的研制[J].安全与环境工程,2002,9(1):27-29. |
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| 作者姓名： | 时国富 储金宇 陈万金 张文英 |
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| 作者单位： | 1. 江苏理工大学,江苏,镇江,212013
2. 浙江金华科学技术学院,金华,321017 |
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| 摘 要： | 本文介绍了未经过干燥处理的原料气进入电晕放电臭氧发生系统后的危害机理 ,根据半导体的制冷干燥机理 ,开发研制了实验室用半导体制冷干燥装置 ,实验证明该装置的研制是成功的。
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| 关 键 词： | 电晕放电 臭氧 半导体制冷 |
| 文章编号： | 1671-1556(2002)-01-0027-03 |
| 修稿时间： | 2001年11月9日 |
The Research and Application of Device for Cooling and Drying by Semi-Conductor in Ozone-Generated System |
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| Shi Guofu ,Chu Jinyu ,Chen Wanjin ,Zhang Wenying.The Research and Application of Device for Cooling and Drying by Semi-Conductor in Ozone-Generated System[J].Safety and Environmental Engineering,2002,9(1):27-29. |
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| Authors: | Shi Guofu Chu Jinyu Chen Wanjin Zhang Wenying |
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| Institution: | Shi Guofu 1,Chu Jinyu 1,Chen Wanjin 1,Zhang Wenying 2 |
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| Abstract: | The harm mechanism was discussed because of the original wet gas entering the ozone system generated by electric arc.Based on the cooling and drying mechanism of the semiconductor,a device was developed which proved to be successful via trials for cooling and drying by semiconductor in laboratory. |
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| Keywords: | ozone system generated by electric arc device for cooling and drying by semiconductor |
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