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基于功能仿真的电子产品性能退化分析方法
引用本文:张辉,王陶,李明,曾晨晖.基于功能仿真的电子产品性能退化分析方法[J].装备环境工程,2014,11(5):43-48.
作者姓名:张辉  王陶  李明  曾晨晖
作者单位:中国航空综合技术研究所,北京,100028
摘    要:目的研究基于功能仿真对电子产品长期工作过程中性能退化问题进行分析的方法。方法以DC-DC电源模块为对象,一种方式是直接对电源模块进行加速退化试验,并基于试验数据进行可靠性分析;另一种方式是对电源模块中性能退化关键元器件进行加速退化试验,并将试验数据模型注入到电源模块功能仿真模型中,进行性能退化仿真与可靠性分析,最终对两种分析结果进行对比,验证仿真分析技术的有效性。结果对比显示,加速退化试验分析得到的电源模块平均寿命为281 560 h,仿真分析得到的电源模块平均寿命为357 290 h。结论由于仿真分析方法只考虑了性能退化的关键元器件,结果偏乐观,但是偏差在合理的范围内,证明该方法对于性能退化可靠性分析是有效的,并且应用该方法更便于进行设计改进和迭代分析。

关 键 词:电子产品  性能退化  仿真分析  加速退化试验
收稿时间:2014/5/30 0:00:00
修稿时间:7/2/2014 12:00:00 AM

Analysis Method of Performance Degradation of Electronic Product Based on Function Simulation
ZHANG Hui,WANG Tao,LI Ming and ZENG Chen-hui.Analysis Method of Performance Degradation of Electronic Product Based on Function Simulation[J].Equipment Environmental Engineering,2014,11(5):43-48.
Authors:ZHANG Hui  WANG Tao  LI Ming and ZENG Chen-hui
Institution:China Aero-Polytechnology Establishment, Beijing 100028, China;China Aero-Polytechnology Establishment, Beijing 100028, China;China Aero-Polytechnology Establishment, Beijing 100028, China;China Aero-Polytechnology Establishment, Beijing 100028, China
Abstract:Objective To study the analysis method of performance degradation during long-term operation based on function simulation. Methods Accelerated degradation test was directly carried out on the power supply module, and the test data was used for reliability analysis. At the same time, accelerated degradation test was carried out on the key components of performance degradation in power supply circuit. The test data was injected into the function simulation model of power supply to simulate performance degradation and analyze the reliability. Finally, the results of the two kinds of analyses were compared to demonstrate the effectiveness of the proposed simulation method. Results Comparison showed that average life span of power supply was 281 560 hours based on the accelerated degradation test while 357 290 hours based on the degradation simulation analysis. Conclusion The result of the simulation method was too optimistic, since it only considered the performance degradation of the key components. But the deviation was within a reasonable range, which proved that the method was effective, and the application of this method could assist design improvement and iterative analysis.
Keywords:electronic product  performance degradation  simulation analysis  accelerated degradation test
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