| 某型固体继电器储存性能退化规律研究 |
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| 引用本文： | 张子华,李坤兰,邱森宝.某型固体继电器储存性能退化规律研究[J].装备环境工程,2009,6(6):39-41. |
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| 作者姓名： | 张子华 李坤兰 邱森宝 |
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| 作者单位： | 1. 空军驻无锡地区军事代表室,江苏,无锡,214063
2. 信息产业部电子五所,可靠性与环境工程中心,广州,510610 |
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| 摘 要： | 选用某型固体继电器在A、B、c、D等4地开展了为期131个月的库房储存试验，跟踪测试了其性能参数。应用F-检验和T-检验对其性能参数的测试数据进行了分析研究，结果表明储存131个月后，输入电流和输出接通电阻在4地有显著性的变化。通过研究4地试验样品性能参数的退化量，结果表明所有性能参数中输出接通电阻的退化量最大；4地相比，C地试验样品的输出接通电阻的退化量是最大的，A地试验样品的输出接通电阻的退化量是最小的。因此，A地最适合该型固体继电器的储存。
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| 关 键 词： | 固体继电器 储存试验 性能参数 退化 T-检验 F-检验 |
Study of Storage Performance Degeneration Rules of Solid State Relay |
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| Institution: | ZHANG Zi-hua , LI Kun-lan, QIU Sen-bao ( 1. Air Force Representative Office of Wuxi Area, Wuxi 214063, China; 2. China Electronic Products Reliability and Environment Institute, Guangzhou 510610, China) |
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| Abstract: | Storage test of some type of SSR were carded out in warehouse at 4 places, A,B,C and D for a period of 131 months. Their functional parameters were tested. The test data were analyzed with F-test and T-test. Degeneration amount of functional parameters were analyzed. The results showed that input current and output contact resistance changed obviously in the 4 places after 131 mouths of storage;output contact resistor is the worst of the functional parameters and output contact resistance of C is the worst of A,B,C and D and output contact resistance of A is the best of A,B,C and D. So A is the best place for this type of SSR. |
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| Keywords: | solid state relay storage test function parameters degeneration T-test F-test |
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