基于故障物理和数理统计相结合的可靠性加速试验方法

目的 研究通过加速试验在较短时间内对高可靠性、小子样电子产品的可靠性进行评估的方法.方法 分析可靠性加速试验方案的特点,梳理可靠性加速试验方案制定的基本流程,通过结合数理统计和故障物理技术,研究加速应力的确定方法和加速因子的计算模型,给出加速试验条件及试验时间的确定流程以及相应的试验结果评估方法,并进行案例应用.结果 该方法克服了常规可靠性加速试验方案设计中仅依靠经验并需要大样本量的缺点,科学有效地解决了高可靠性、小样本产品的可靠性加速试验方案设计问题,形成了电子设备基于故障物理和数理统计相结合的可靠性加速试验方案设计方法,经验证合理可行.结论 该试验方法能够满足当前可靠性要求高、进度紧、受试样品有限的武器装备研制的需求.

Accelerated Reliability Test Method Based on the Combination of Fault Physics and Mathematical Statistics

This paper aimsto study the method of assessing the reliability of highly reliable, small sample electronic products in a relatively short period of time through accelerated testing. This passage first of all analyzes the trait of accelerated reliability test and summarizes the basic process of reliability accelerated test program development. By combining mathematical statistics and failure physics techniques, the method of determining accelerated stress and the calculation model of acceleration factor are studied, the process of determining accelerated test conditions and test time as well as the corresponding test result evaluation method are given, and case applications are conducted. This method overcomes the shortcomings of relying only on experience and requiring a large sample size in the conventional reliability accelerated test program design, scientifically and effectively solves the problem of reliability accelerated test program design for high-reliability, small-sample products, and forms an electronic device based on fault The design method of the reliability accelerated test scheme that combines physical and mathematical statistics has been verified to be reasonable and feasible.This test method can meet the needs of weapons and equipment developed by high reliability, tight progress, limited sample.