| 军用集成电路质量控制方法分析与探讨 |
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| 引用本文： | 孙家坤,姚鼎.军用集成电路质量控制方法分析与探讨[J].环境技术,2016(6):22-25. |
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| 作者姓名： | 孙家坤 姚鼎 |
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| 作者单位： | 中船重工第716研究所,连云港,222000 |
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| 摘 要： | 集成电路是军用电子设备最重要的器件之一,集成电路的质量直接影响到军用装备的质量。从集成电路的选择、二次筛选和破坏性物理分析(DPA)这几个方面探讨了军用集成电路的质量控制方法。实践证明通过质量控制筛选得到的集成电路整批使用可靠性都有明显的提高。
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| 关 键 词： | 集成电路 二次筛选 破坏性物理分析 |
Analysis and Discussion on Quality Control Method for Integrated Circuit |
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| Abstract: | Integrated circuit is regarded as one of the most important components for military electronic equipment, and IC quality directly influences the quality of military equipment. This paper discusses quality control method for military IC in the light of IC selection, secondary screening and destructive physical analysis (DPA). The practice proves that overall operation reliability of the IC through screening is significantly improved. |
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| Keywords: | integrated circuit secondary screening destructive physical analysis |
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