管式膜分离器净化含苯废气的研究

试验以管式硅橡胶膜分离器处理含苯废气,测定了在此种膜分离器中含有苯、二甲苯的废气对空气的分离因子,并推导出分离因子与流过管式膜分离器的气体雷诺数关系.低浓度含苯废气经膜分离使苯蒸气富集,然后加以回收或以催化燃烧方法处理。     

峨嵋山冷杉衰亡与酸性降水关系的初步研究

本文报道了峨嵋山高海拔地区冷杉衰亡与酸性降水关系的调查和研究,内容包括酸性降水和气态污染物状况的观察,冷杉枝叶生长状况和针叶解剖,树干解剖和根系观察,冷杉冠层对酸性降水的反应及酸性降水在生态系统中的变化,土壤和冷杉的元素分析等方面,并就酸性降水对冷杉衰亡的影响进行了初步评价结果指出,峨嵋山高海拔地区的酸性降水污染严重,雨水的平均pH值为1.37,酸雨频率达85.1:雾水的pH值为1.62,酸雾频率达100 有可能对冷杉产生直接和间接影响。      

改装 Model 42S 化学发光氮氧化物仪测定大气中NO-NOx-NOy

将美国Ｍｏｄｅｌ４２Ｓ化学发光ＮＯ－ＮＯｘ测定仪改装为ＮＯ－ＮＯｘ－ＮＯｙ同机测量．使用ＮＨ４ＮＯ３标定了不锈钢ＮＯｙ转化器．在６６０±１０℃,不锈钢转化器对ＨＮＯ３和ＮＨ３的转化效率分别为１００％和８０％—９０％．在该温度下,没有发现Ｎ２Ｏ被不锈钢转化器转化为ＮＯ．改装后仪器的分辨率、检测限、响应速率和线性度均未改变．根据对ＨＮＯ３的研究结果,该仪器的ＮＯｙ转化器带来的测量误差不大于５％．使用改装后的仪器连续测定了大气中的ＮＯ－ＮＯｘ－ＮＯｙ,得到可靠、合理的数据     

Outdoor air pollution exposure and the risk of asthma and wheezing in the offspring

Environmental Science and Pollution Research - According to the “fetal origin of disease” hypothesis, air pollution exposure in pregnancy may play an important role in stimulating the...     

根际土壤中DDTs的残留与转化

通过根垫法研究DDT的五种异构体p,p‘-DDE,o,p’-DDD,p,p‘-DDD,o,p‘-DDT,p,p‘-DDT在小麦根际土壤和非根际土壤中的残留量以及DDT,DDD和DDE之间的转化．结果发现,在40d试验期间内,DDT发生缓慢降解,根际土壤中的降解略快于非根际土壤,且差别主要表现在生成DDD的厌氧过程方面．此外,根际土壤中五种DDT的异构体的可提取残留都高于非根际土壤,说明该农药的锁定过程在根际环境相对较弱．     

石墨矿废弃地生态复垦研究

通过现场试验和小区工程措施,研究了石墨矿废弃地的生态复垦问题并建立了复垦示范田。结果表明,通过一定的技术工程措施石墨矿废弃矿坑和尾渣堆的复垦土地的理化性质基本达到了当地农业耕地的水平。从技术、经济的角度分析,石墨矿废弃地复垦的关键是耕种层的熟土配比。经筛选后的矿渣或矿毛与熟土按1:1或1:2的比例混配都可达到生态复垦的目的,但是前者的保水、供水、供肥能力不及后者。     

酸性淋溶对铅锌尾矿金属行为的影响及植物毒性

露天存放的铅锌尾矿受到自身酸化和酸雨的双重影响,从而加剧尾矿对环境的影响。因此,研究尾矿在酸性条件下的重金属行为及其植物毒性,对植物在铅锌尾矿地的自然定居有非常重要的意义。将铅锌尾矿砂装柱,用pH2～7溶液淋溶50天的结果表明,酸度的提高可以显著地增加尾矿砂中重金属（Pb、Zn、Cu和Cd）的溶出。而随着时间的延长,Zn的溶出量明显增高,Pb和Cu的溶出则逐渐降低。在pH值＜3时,Cd的溶出逐渐升高,pH值＞3时,Cd的溶出也呈下降趋势。酸度对重金属溶出的影响由大至小依次为Zn＞Cd＞Cu＞Pb。渗滤液对植物的毒性随着起始淋溶酸度的提高与时间的推移而加剧     

Location and Characterization of Emission Sources for Airborne Volatile Organic Compounds Inside a Refinery in Taiwan

This study aimed to locate VOC emission sources and characterized their emitted VOCs. To avoid interferences from vehicle exhaust, all sampling sites were positioned inside the refinery. Samples, taken with canisters, were analyzed by GC–MS according to TO-14 method. The survey period extended from Febrary 2004 to December 2004, sampling twice per season. To interpret a large number of VOC data was a rather difficult task. This study featured using ordinary application software, Excel and Surfer, instead of expensive one like GIS, to overcome it. Consolidating data into a database on Excel facilitated retrieval, statistical analysis and presentation in the form of either table or graph. The cross analysis of the data suggested that the abundant VOCs were alkanes, alkenes, aromatics and cyclic HCs. Emission sources were located by mapping the concentration distribution of these four types of VOCs in terms of contour maps on Surfer. During eight surveys, five emission sources were located and their VOCs were characterized.     

废弃饱和盐水钻井液的固液分离

采用化学破胶脱稳和压滤机械分离的化学强化固液分离技术处理江汉油田废弃饱和盐水钻井液(简称废钻井液).最佳固液分离工艺为:调节废钻井液的pH为6.5左右,先加入无机破胶剂(HWJ),HWJ的加入量为15 000 mg/L,以400 r/min的转速搅拌3 min,稀释1倍后,再加入有机破胶剂(HYJ),HYJ的加入量为300 mg/L,以120 r/min的转速搅拌5min.固液分离结果表明,分离后出水率达68.2%,而泥饼湿含量只有55.8%,废钻井液的COD由67 886.8 mg/L降至8 898.9 mg/L.     

Emergency response study for chemical releases in the high-tech industry in Taiwan—A semiconductor plant example

In the past two decades, there has been continuous investment and expansion of semiconductor, photoelectric panel, or solar cell plants in the high-tech industry. For example, establishing a semiconductor plant costs about US$ 3 billion. In addition, the output value of integrated circuits (IC) of Taiwan as a whole is estimated to be about US$ 5.215 billion, and globally of US$ 275.2 billion in 2008. A large amount and a variety of specialty gases or chemicals are applied during processes in high-tech facilities and these chemicals are characterized by inflammability, toxicity, and corrosiveness. Accidents may result once errors or leaks occur in any part of the supply chain, which consists of storage facilities, supply equipment, process machines, and tail gas elimination devices. Personnel casualties can result in serious situations. This study discusses the emergency response procedures and common response defects in semiconductor plants with a view to enhancing emergency response effects and capabilities, avoiding casualties, reducing property loss and shortening operation interruption.