弹上电子部件加速因子估计方法研究

目的针对高可靠长寿命的弹上电子部件在实际贮存环境温度起伏变化的情况,研究基于等效温度的加速因子估计方法。方法首先剖析弹上电子部件失效机理,然后基于阿伦尼斯模型,分析加速应力与实际环境温度的对应关系,求解实际环境等效温度,进而估计加速因子,最后通过某型导弹综合控制器中的时序控制电路板,验证该方法的工程适用性。结果该方法能够真实反映环境温度情况,且与传统加权平均温度计算方法相比,加速因子估计和加速试验时间预测更准确,且随着实际环境温度起伏的增大,优势更加明显。结论该方法在实际贮存环境温度起伏变化的情况下,能够有效提高加速因子估计和加速寿命试验时间预测的准确性,为弹上电子部件加速寿命试验方案设计提供可靠依据,对其他高可靠长寿命产品的加速因子估计也具有一定的参考价值。

Acceleration Factor Estimation of Missile-borne Electronic Components

The paper aims to study the acceleration factor estimation method based on equivalent temperature for the high reliability and long life electronic components in the actual storage environment. Firstly, the failure mechanism of electronic equipment on the missile is analyzed. Then based on Arrhenius model, the corresponding relationship between acceleration stress and actual environment temperature is analyzed, and the equivalent temperature is solved to estimate the acceleration factor. And then the method is used to the timing controller circuit board in a missile integrated controller. The results show that compared with the traditional temperature calculation method by weighted average, this method is more accurate in the acceleration factor estimation and the acceleration test time prediction, and the advantages are more obvious with the increase of the fluctuation of actual environment temperature.This method can effectively improve the accuracy of the estimation of acceleration factor and the prediction of acceleration test time, thus providing effective support for the design of accelerated life test scheme of electronic equipment on the missile. It also has a certain reference value for the acceleration factor estimation of other high reliability and long life products.