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半导体存储介质破碎-分选系统的因子优化设计
引用本文:王策,许振明.半导体存储介质破碎-分选系统的因子优化设计[J].环境工程学报,2017,11(2):1111-1116.
作者姓名:王策  许振明
作者单位:1.上海交通大学环境科学与工程学院, 上海 200240
基金项目:国家高技术研究发展计划(863计划)项目(2009AA06Z318)
摘    要:废弃半导体存储介质一方面载有隐私信息,需要被安全销毁,另一方面富含金属导体、半导体、绝缘体材料,极具回收价值。提出用破碎-风力-高压静电分选系统对其进行安全销毁和物料分选,其中多级破碎部分使信息半导体硅存储材料破碎至0.80 mm以下,而风力-高压静电分选部分能实现半导体、导体、绝缘体的分选。为确定系统工艺参数,实验对风机蝶阀角度(α),风机频率(f),电选电压(U),电选机转辊转速(n)等因素对半导体收集量(M)的影响进行研究,通过因子设计建立了非线性数学模型:M=1.943 8-0.418 7α*+0.306 2f*-0.193 7 f*U*n*+0.181 3α*f*U。进而通过响应优化得出最优工艺参数设置为:α=30°,f=45 Hz,U=30 kV,n=40 r·min-1。在此参数下,金属导体收集率达90.3%,半导体硅收集率达61.0%,实现了半导体存储介质破碎销毁和物料分选。

关 键 词:半导体存储介质    风力分选    高压静电分选    因子设计    响应优化
收稿时间:2015-11-26

Factor design of crushing-cyclone-electrostatic separation system for recovery of semiconductor storage medium
WANG Ce,XU Zhenming.Factor design of crushing-cyclone-electrostatic separation system for recovery of semiconductor storage medium[J].Techniques and Equipment for Environmental Pollution Control,2017,11(2):1111-1116.
Authors:WANG Ce  XU Zhenming
Institution:1.School of Environmental Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
Abstract:Storage mediums need to be destroyed safely to protect privacy and their valuable conductor, semiconductor, and nonconductor material needs to be recycled. The suitability of a crushing-cyclone-high voltage electrostatic separation system was investigated for this purpose. Semiconductor information storage material must be crushed into fragments no larger than 0.80 mm Cyclone and high voltage electrostatic separation can achieve resource recovery. In order to determine the parameters of the system, a nonlinear mathematical model was established after studying the relationship between the semiconductor quality (M) and the butterfly angle (α), fan frequency (f), electric voltage (U), and the speed of rotation (n):M=1.943 8-0.418 7α*+0.306 2f*-0.193 7f*U*n*+0.181 3α*f*U. Thus, the optimal parameters of the process obtained are as follows:α=300, f=45 Hz, U=30 kV, and n=40 r·min-1. Using these parameters, the collection rate of the metal conductor was above 90%, and the collection rate of semiconductor silicon was 61%. The safe destruction and resource recovery of the semiconductor storage medium was achieved.
Keywords:semiconductor storage medium  Cyclone Separation  High-voltage Electrostatic Separation  factor design  response surface methodology
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