| 电子产品高加速应力筛选的应用探讨 |
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| 引用本文： | 李劲,张蕊.电子产品高加速应力筛选的应用探讨[J].环境技术,2012(3):5-10. |
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| 作者姓名： | 李劲 张蕊 |
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| 作者单位： | 工业和信息化部电子第五研究所,广州,510610 |
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| 摘 要： | 本文论述了电子产品高加速应力筛选试验的流程和方法,包括高加速应力筛选试验剖面设计和筛选验证等,并将该试验方法在某机载惯导产品进行了应用。这一方法对于其他机载电子产品的高加速筛选工作有一定的指导意义。
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| 关 键 词： | 电子产品 高加速应力筛选 故障注入 筛选效率 寿命损失 |
Discussion on Application of Electronic Products Highly Accelerated Stress Screening |
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| LI Jing
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ZHANG Rui.Discussion on Application of Electronic Products Highly Accelerated Stress Screening[J].Environmental Technology,2012(3):5-10. |
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| Authors: | LI Jing ZHANG Rui |
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| Institution: | (China Electronic Product Reliability and Environmental Testing Research Institute, Guangzbou 510610) |
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| Abstract: | The paper discussed the procedure and method of electronic products highly accelerated stress screening test, including profile design and screen validation and so on, while also applied this method to certain airborne inertial navigation product. This technology serves as a＇direction for highly accelerated stress screening of other Aircraft electronic products. |
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| Keywords: | electronic products HASS： fault injection screening efficiency loss of life |
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