Characterisation and Nanomechanical Properties of Ink-Jet Media Using Atomic Force Microscopy

Commercial inkjet media is increasingly used in daily life; this use ranges from offices to digital photography. The impact that the development of this technology has had on the paper industry has been phenomenal. However, an increasing amount of paper is discarded and it is often after the introduction of complex chemical ink within its substrate. The understanding of the interactions between the layer of coated media and ink can be used to further understand and develop technology for the use of recycling office and photo papers. This paper presents the innovative concept in characterizing the surface of the inkjet media by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Comparisons are made between the data obtained from both atomic force microscopy and scanning electron microscopy of the receptive layer and surface analysis software that was used to obtain surface characteristics. In this study the hardness and force of interaction has also been examined by the means of nanoindentation measurements using silicon nitride cantilever tips and forces of interaction between a selection of colloid probes and the receptive layer of the inkjet media. The effect of loading force on indentation was studied in terms of approach of impact and type of media tested.