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光电产品可靠性试验常见故障分析
引用本文:金玫,王晓红.光电产品可靠性试验常见故障分析[J].装备环境工程,2005,2(2):34-38.
作者姓名:金玫  王晓红
作者单位:北京航空航天大学工程系统工程系,北京,100083;北京航空航天大学工程系统工程系,北京,100083
摘    要:结合型号可靠性试验工作。阐述了光电产品可靠性试验的特点及其故障判据。针对光学器件和光电产品的特点,以光电显示系统、瞄准具及热像仪等产品为例。对光电产品在可靠性试验过程中发生的故障模式、故障机理和故障原因进行了分析。

关 键 词:光电产品  可靠性试验  故障模式  纠正措施
文章编号:1692-9242(2005)02-0034-05
收稿时间:2005-02-01
修稿时间:2005年2月1日

The Analysis of Usual Failure in the Reliability Test of Photoelectric Product
JIN Mei,WANG Xiao-hong.The Analysis of Usual Failure in the Reliability Test of Photoelectric Product[J].Equipment Environmental Engineering,2005,2(2):34-38.
Authors:JIN Mei  WANG Xiao-hong
Institution:Beijing Univcnsity of Aeronautics and Astronautics, Beijing 100083, China
Abstract:Combining with the work of reliability test of the model's the feature of the photoelectric product reliability test was expatiated. The failure mode, failure mechanism and failure causation in the reliability of photoelectric product were analyzed by using some products as the examples, such as photoelectric display system, collimator, and thermal imaging instrument.
Keywords:photoelectric product  reliability test  failure mode  correction action
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