Current Mode Atomic Force Microscopy (C-AFM) Study for Local Electrical Characterization of Conjugated Polymer Blends |
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| Authors: | Li-Ting Lee Shinzaburo Ito Hiroaki Benten Hideo Ohkita Daisuke Mori |
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| Institution: | 1.Department of Polymer Chemistry, Graduate School of Engineering,Kyoto University,Kyoto,Japan;2.Department of Materials Science and Engineering,Feng Chia University,Taichung,Taiwan, ROC |
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| Abstract: | A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{N,N′-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5′-(2,2′-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM. |
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