| 舰船电子设备高强度冲击试验和抗冲击设计探讨 |
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| 引用本文： | 胡秀英. 舰船电子设备高强度冲击试验和抗冲击设计探讨[J]. 装备环境工程, 2007, 4(5): 40-43 |
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| 作者姓名： | 胡秀英 |
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| 作者单位： | 中国电子科技集团公司第二十九研究所,成都,610036 |
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| 摘 要： | 介绍了舰船冲击试验的发展状况和舰船电子设备高强度冲击试验方法,针对舰船电子设备在作战中遭受到来自水下武器爆炸所产生的非接触爆炸而引起的高强度冲击的特点,对舰船电子设备抗冲击设计进行了探讨.
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| 关 键 词： | 舰船 电子设备 高强度冲击 冲击试验 |
| 文章编号： | 1672-9242（2007）05-0040-04 |
| 修稿时间： | 2007-05-25 |
Discussion on High Intensity Shock Test and Anti-shock Design of Carrier-borne Electronic Equipment |
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| HU Xiu-ying. Discussion on High Intensity Shock Test and Anti-shock Design of Carrier-borne Electronic Equipment[J]. Equipment Environmental Engineering, 2007, 4(5): 40-43 |
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| Authors: | HU Xiu-ying |
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| Affiliation: | Southwest Research Institute of Electronic Equipment, Chengdu 610036, China |
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| Abstract: | The development of ship shock test and the high intensity shock test method of cartier-borne electronic equipment were introduced. Cartier-borne electronic equipments may encounter high intensity shock due to non-contact explosion produced by torpedo and mine. The anti-shock design method for carrier-borne electronic equipment was discussed according to this character. |
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| Keywords: | ship electronic equipment high intensity shock shock test |
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