国产多核处理器芯片TDBI技术研究

随着集成电路的功能越来越复杂,超大规模集成电路的动态老炼越来越成为一项困难的工作。传统针对超大规模集成电路的老炼多采用静态老炼方法,这种方法不能使电路内部的功能节点动作起来,无法保证老炼效果,因此能够实现电路内部所有功能模块全动态激励的TDBI技术越来越受到人们的关注。本文以国产多核处理器芯片为测试对象,为研究多核处理器芯片的TDBI方法进行了芯片老炼测试软硬件系统开发,解决了多核处理器老炼中大功率电源供电、图形存储空间不足等关键技术。

Technique Study in Test-During-Burn-In for Domestic Multi-core Processor

Now the function of IC is more complex, the dynamic burn-in of VLSI is more difficult. The static burn-in is used widely for the traditional burn-in of VLSI, but this method can’t drive the inner node of VLSI, so the TDBI （Test-During-Burn-In） which can drive the inner modules is more and more regarded by people. In the paper, the domestic multi-core processor was the object that has been tested, and we have designed the software and hardware system which has been researched for the domestic multi-core processor in TDBI, and the system can settle the pivotal technique which is composed of the high-power supple and the graphics-memory interspace in burn-in for multi-core processor.